T1 - Dependable AI and AI for Testing

 

Haralampos Stratigopoulos

 

 

Giulio Gambardella

 

T2 - Functional Safety and Reliability

 

Riccardo Cantoro

 

 

Jyotika Athavale

 

T3 - Emerging technologies and architectures

 

Rajendra Bishnoi

 

 

Marco Ottavi

 

T4 - Security and Trust

 

Ilia Polian

 

 

Johanna Sepulveda

 

T5 - Test and Reliability for Analog, Mixed-Signal, RF

 

Anthony Coyette

 

 

Florence Azais

 

T6 - DFT and Test Access Standards

 

Martin Keim

 

 

Jennifer Dworak

 

T7 - Validation, Verification, Debug and Diagnosis

 

Graziano Pravadelli

 

 

Daniel Grosse

 

T8 - Test generation, Fault Simulation, Fault Tolerance, Application and evaluation

 

Stelios Neophytou

 

 

Rene Krenz-Baath