T1 - Dependable AI and AI for Testing
 |
Haralampos Stratigopoulos
|
 |
Giulio Gambardella
|
T2 - Functional Safety and Reliability
 |
Riccardo Cantoro
|
 |
Jyotika Athavale
|
T3 - Emerging technologies and architectures
 |
Rajendra Bishnoi
|
 |
Marco Ottavi
|
T4 - Security and Trust
 |
Ilia Polian
|
 |
Johanna Sepulveda
|
T5 - Test and Reliability for Analog, Mixed-Signal, RF
 |
Anthony Coyette
|
 |
Florence Azais
|
T6 - DFT and Test Access Standards
 |
Martin Keim
|
 |
Jennifer Dworak
|
T7 - Validation, Verification, Debug and Diagnosis
 |
Graziano Pravadelli
|
 |
Daniel Grosse
|
T8 - Test generation, Fault Simulation, Fault Tolerance, Application and evaluation
 |
Stelios Neophytou
|
 |
Rene Krenz-Baath
|