T1 - Dependable AI and AI for Testing
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Haralampos Stratigopoulos
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Giulio Gambardella
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T2 - Functional Safety and Reliability
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Riccardo Cantoro
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Jyotika Athavale
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T3 - Emerging technologies and architectures
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Rajendra Bishnoi
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Marco Ottavi
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T4 - Security and Trust
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Ilia Polian
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Johanna Sepulveda
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T5 - Test and Reliability for Analog, Mixed-Signal, RF
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Anthony Coyette
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Florence Azais
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T6 - DFT and Test Access Standards
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Martin Keim
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Jennifer Dworak
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T7 - Validation, Verification, Debug and Diagnosis
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Graziano Pravadelli
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Daniel Grosse
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T8 - Test generation, Fault Simulation, Fault Tolerance, Application and evaluation
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Stelios Neophytou
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Rene Krenz-Baath
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